Philippe Pougnet

Nanometer-Scale Defect Detection Using Polarized Light

2016

Applications and Metrology at Nanometer-Scale 2

2021

Applications and Metrology at Nanometer Scale 1

2021

Systèmes Mécatroniques Embarqués

2015

Embedded Mechatronic Systems

2019

Embedded Mechatronic Systems, Volume 2

2020

Embedded Mechatronic Systems, Volume 2 Vol. 2

2015

Embedded Mechatronic Systems, Volume 1

2019

Embedded Mechatronic Systems, Volume 1 Vol. 1

2015

Embedded Mechatronic Systems Vol. 2

2015

Embedded Mechatronic Systems Vol. 1

2015

Embedded Mechatronic Systems 2

2020